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portada Coupled Diffusion of Impurity Atoms and Point Defects in Silicon Crystals
Type
Physical Book
Language
Inglés
Pages
404
Format
Hardcover
Dimensions
22.9 x 15.2 x 2.4 cm
Weight
0.71 kg.
ISBN13
9781786347152

Coupled Diffusion of Impurity Atoms and Point Defects in Silicon Crystals

Oleg Velichko (Author) · World Scientific Publishing Europe Ltd · Hardcover

Coupled Diffusion of Impurity Atoms and Point Defects in Silicon Crystals - Velichko, Oleg

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Origin: U.S.A. (Import costs included in the price)
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Synopsis "Coupled Diffusion of Impurity Atoms and Point Defects in Silicon Crystals"

This work presents a comprehensive theory describing atomic diffusion in silicon crystals under strong nonequilibrium conditions caused by ion implantation and interaction with the surface or other interfaces. A set of generalized equations that describe diffusion of impurity atoms and point defects are presented in a form suitable for solving numerically. Based on this theory, partial diffusion models are constructed, and the simulation of many doping processes used in microelectronics is carried out.Coupled Diffusion of Impurity Atoms and Point Defects in Silicon Crystals is a useful text for researchers, engineers, and advanced students in semiconductor physics, microelectronics, and nanoelectronics. It helps readers acquire a deep understanding of the physics of diffusion and demonstrates the practical application of the theoretical ideas formulated to find cheaper solutions in the course of manufacturing semiconductor devices and integrated microcircuits.

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