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Ellipsometry: Principles and Techniques for Materials Characterization
Wahaia, Faustino (Author)
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Intechopen
· Hardcover
Ellipsometry: Principles and Techniques for Materials Characterization - Wahaia, Faustino
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Origin: U.S.A.
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Thursday, August 01 and
Thursday, August 08.
You will receive it anywhere in United Kingdom between 1 and 3 business days after shipment.
Synopsis "Ellipsometry: Principles and Techniques for Materials Characterization"
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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