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portada Enhancement the Voltage Clamp Technique Under Noisy Input Currents
Type
Physical Book
Language
Inglés
Pages
60
Format
Paperback
Dimensions
22.9 x 15.2 x 0.4 cm
Weight
0.10 kg.
ISBN13
9783330335158

Enhancement the Voltage Clamp Technique Under Noisy Input Currents

Ahmed Mahmood Khudhur (Author) · Yasir H. Naif (Author) · Abdolbaqi Mohammed Khdher (Author) · LAP Lambert Academic Publishing · Paperback

Enhancement the Voltage Clamp Technique Under Noisy Input Currents - Khudhur, Ahmed Mahmood ; Naif, Yasir H. ; Khdher, Abdolbaqi Mohammed

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£ 39.06

  • Condition: New
Origin: U.S.A. (Import costs included in the price)
It will be shipped from our warehouse between Wednesday, August 14 and Wednesday, August 21.
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Synopsis "Enhancement the Voltage Clamp Technique Under Noisy Input Currents"

Our brains keep working despite frequent failures of their component neurons, and this 'fault-tolerant' characteristic is of great interest to engineers who wish to make computers more reliable. Neuroscience is by far the most exciting branch of science because the brain is the most fascinating object in the universe. Every human brain is different - the brain makes each human unique and defines who he or she is.

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