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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
R. Dean Adams
(Author)
·
Springer
· Paperback
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Adams, R. Dean
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Origin: U.S.A.
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Synopsis "High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test"
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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