Name: in-situ electron microscopy: applications in physics, chemistry and materials science
Price: 121.46 GBP
Availability: InStock
Author: gerhard dehm, james m. howe, josef zweck
ISBN: 9783527319732

portada in-situ electron microscopy: applications in physics, chemistry and materials science

Type

Physical Book

Publisher

wiley-vch

Author

gerhard dehm, james m. howe, josef zweck

Pages

402

ISBN

3527319735

ISBN13

9783527319732

Synopsis "in-situ electron microscopy: applications in physics, chemistry and materials science"

the book explains firstly the basic principles of modern focused ion beam workstations (fib), scanning electron microscopes (sem) and transmission electron microscopes (tem) and subsequently what kind of in-situ experiments can be performed to obtain information on the various material properties. information on the test techniques, data evaluation, and interpretation of the obtained results is provided by leading experts in the field.