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mems reliability
Allyson L. Hartzell
(Author)
·
Mark G. Da Silva
(Author)
·
Herbert R. Shea
(Author)
·
Springer
· Paperback
mems reliability - Hartzell, Allyson L. ; Da Silva, Mark G. ; Shea, Herbert R.
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Origin: U.S.A.
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Thursday, August 15.
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Synopsis "mems reliability"
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it.MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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