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microelectronic reliability vol. i: test and diagnostics
Edward B. Hakim
(Author, Introduction by, Preface by)
·
Artech House Publishers
· Hardcover
microelectronic reliability vol. i: test and diagnostics - Hakim, Edward B. ; Hakim, Edward B. ; Hakim, Edward B.
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Origin: U.S.A.
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Synopsis "microelectronic reliability vol. i: test and diagnostics"
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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