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Test Generation of Crosstalk Delay Faults in Vlsi Circuits
S. Jayanthy; M.c. Bhuvaneswari (Author)
·
Springer
· Hardcover
Test Generation of Crosstalk Delay Faults in Vlsi Circuits - S. Jayanthy; M.C. Bhuvaneswari
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Origin: U.S.A.
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Synopsis "Test Generation of Crosstalk Delay Faults in Vlsi Circuits"
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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