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Ultimate Limits of Fabrication and Measurement
Welland, M. E. ; Gimzewski, J. K. (Author)
·
Springer
· Paperback
Ultimate Limits of Fabrication and Measurement - Welland, M. E. ; Gimzewski, J. K.
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Origin: U.S.A.
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Synopsis "Ultimate Limits of Fabrication and Measurement"
An extensive body of research is involved in pushing miniaturisation to its physical limit, encompassing the miniaturisation of electronic devices, the manipulation of single atoms by scanning tunnelling microscopy, bio-engineering, the chemical synthesis of complex molecules, microsensor technology, and information storage and retrieval. In parallel to these practical aspects of miniaturisation there is also the necessity to understand the physics of small structures. Ultimate Limits of Fabrication and Measurement brings together a number of leading articles from a variety of fields with the common aim of ultimate miniaturisation and measurement.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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