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Uncertainty Analysis For NIST Noise-Parameter Measurement
U. S. Department of Commerce
(Author)
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Createspace Independent Publishing Platform
· Paperback
Uncertainty Analysis For NIST Noise-Parameter Measurement - U. S. Department of Commerce
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Synopsis "Uncertainty Analysis For NIST Noise-Parameter Measurement"
Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
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