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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Sadewasser, Sascha ; Glatzel, Thilo (Author)
·
Springer
· Paperback
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Sadewasser, Sascha ; Glatzel, Thilo
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Synopsis "Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization"
Presents the applications of Kelvin probe force microscopy in nanotechnologyProvides an in-depth description of a variety of theoretical and experimental aspects of the techniqueIncludes contributions by the leading experts in the field
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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